HIOKI Japan

FA1220-02 In-Circuit Tester

The Hioki FA1220-02 In-Circuit Tester is a specialized, high-performance automatic testing system used for generating pass/fail judgments on populated printed circuit boards (PCBAs) in high-volume production environments. Its main purpose is to ensure the quality and reliability of electronic components after they have been mounted onto the circuit board. Batch Testing System for Improved Populated Circuit Board Productivity.

• Component Testing: It performs extensive testing on various electronic components mounted on the board, including resistors, capacitors, diodes, transistors, and integrated circuits (ICs).
• Defect Detection: The system uses numerous measurement parameters to detect a wide variety of defects, such as open circuits, short circuits, incorrect component values, reversed insertion of polarized components (like electrolytic capacitors and some ICs), and general component failures.
• Precise Measurement: It has the capability for ultra-low resistance measurement (milliohm range), which is crucial for verifying proper connections and solder joints.
• Production Quality Assurance: The tester is designed for use in manufacturing and production lines to perform batch testing and maintain high-quality standards for electronic products.

Video: Revolutionizing PCB Testing HIOKI FA1220 in Action! | IN-CIRCUIT TESTER | Populated Circuit Board

• Streamlined Workflow: A “slide-in” mechanism for test fixtures simplifies their installation and removal, which significantly reduces the manual labor and time required for changeovers between different board types.
• Automation Integration: The compact, modular design of the FA1220-02 allows for easy integration into automated test equipment and cell production systems, supporting efficient, modern “smart factory” approaches.
• Scalability: The system is highly integrated and can support up to 2,048 test points, providing extensive testing coverage without requiring additional floor space compared to previous models.

Specifications:

Measurement unit
DC voltmeter: 800 μV fs to 25 V fs, 8 ranges
DC ammeter: 100 nA fs to 250 mA fs, 9 ranges
AC ammeter: 10 μA rms to 10 mA rms, 4 ranges
HV voltmeter: 25 mV fs to 250 V fs (Requires E4210 and E4203)
HV ammeter: 1.2 μA fs to 120 mA fs (Requires E4210 and E4203)

Number of test points Standard: 0 pins (scanner boards optional)
Max. 2048 pins (expandable in blocks of 128 pins)*
* The maximum number of active pins for each test type depends on the total number of scanner board pins installed in the product.

Number of test steps Group data: 256 groups
Round-robin short/open data: 2048 pins*
Macro data: 2048 pins*/2048 steps (regardless of pin count)
Component data: 10,000 steps
Charge data: 40 groups
PIN contact data: 2048 pins*
IC data: 500 steps (max. 2048 pins/step)*

Scanner unit Switch type: analog (Scanner Board E4201 and E4202), read relay (Scanner Board E4203)
Number of channels: 128 per board
Input protection: ±15 V (Scanner Board E4201 and E4202), none (Scanner Board E4203)
External I/O

Included accessories: Instruction Manual ×1, Test lead ×1, Application disc ×1, Positioning screws ×4, Maintenance key (for opening and closing the maintenance door) ×1